We are proud to announce the appointment of Eric De Mey as Chief Technology Officer (CTO) of Delvitech’s semiconductors division, marking a strategic milestone in the company’s technological expansion into the semiconductor and microelectronics sector.
With more than 35 years of experience in semiconductors, IC development, RF technologies, and international engineering leadership, Eric brings extraordinary expertise to Delvitech’s next phase of growth. Throughout his career, he has led advanced chip development programs, built high-performance engineering organizations, and contributed to the evolution of semiconductor technologies from startup environments to global industrial scale.
Semiconductor leadership experience across Europe and international markets
Deep expertise in analog, digital and RF integrated circuit technologies
Proven track record in innovation, production quality and strategic technology roadmaps
At the same time, Delvitech officially expands its AI-native inspection vision into a new frontier:
semiconductors, microelectronics and chiplets inspection.
This strategic evolution opens the path toward future Delvitech platforms dedicated to next-generation microelectronics inspection, extending the company’s Physical AI approach beyond traditional AOI applications.
A new generation of Physical AI inspection for microelectronics and chiplets.
Eric’s arrival strengthens Delvitech’s ambition to become a key technology player in advanced industrial inspection, bridging electronics manufacturing, semiconductor innovation, and Physical AI.
The future of inspection is expanding.